The Radiation Resistance of Microelectronic Devices under the Combined Influence of Destabilizing Factors of Space at the Design Stage
- 作者: Didyk P.I.1, Zhukov A.A.2
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隶属关系:
- Moscow Aviation Institute (National Research University), 125993, Moscow, Russia
- Moscow Aviation Institute, (National Research University)
- 期: 卷 61, 编号 3 (2023)
- 页面: 242-247
- 栏目: Articles
- URL: https://rjmseer.com/0023-4206/article/view/672659
- DOI: https://doi.org/10.31857/S0023420622600209
- EDN: https://elibrary.ru/BVDRNL
- ID: 672659
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