Determination of the structure of weakly ordered films according to x-ray diffraction data
- Authors: Astaf’ev S.B.1, Yanusova L.G.1
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Affiliations:
- Shubnikov Institute of Crystallography of Kurchatov Complex of Crystallography and Photonics of NRC “Kurchatov Institute”
- Issue: Vol 69, No 3 (2024)
- Pages: 505-510
- Section: ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ
- URL: https://rjmseer.com/0023-4761/article/view/673191
- DOI: https://doi.org/10.31857/S0023476124030163
- EDN: https://elibrary.ru/XOAVGD
- ID: 673191
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