X-RAY REFLECTOMETRY OF THIN FILMS FORMED DURING PHASE SEPARATION OF ORGANIC SOLUTIONS OF ALIPHATIC POLYETHERS IN WATER
- Authors: Asadchikov V.E.1, Volkov Y.O.1, Roshchin B.S.1, Nuzhdin A.D.1, Chernavskay E.R.2, Tikhonov A.M.3, Mironov A.V.1, Mariyanac A.O.1, Popov V.K.1
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Affiliations:
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia
- National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Moscow, 115409 Russia
- Kapitza Institute for Physical Problems, Russian Academy of Sciences, Moscow, 119334 Russia
- Issue: Vol 68, No 1 (2023)
- Pages: 94-99
- Section: ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ
- URL: https://rjmseer.com/0023-4761/article/view/673557
- DOI: https://doi.org/10.31857/S0023476123010022
- EDN: https://elibrary.ru/DMWVLY
- ID: 673557
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