FEATURES OF THE APPLICATION OF MATHEMATICAL OPTIMIZATION METHODS FOR THE STUDY OF NANOSTRUCTURES BASED ON X-RAY DIFFRACTION DATA
- Authors: Astaf’ev S.B.1, Yanusova L.G.1
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Affiliations:
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia
- Issue: Vol 68, No 1 (2023)
- Pages: 100-104
- Section: ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ
- URL: https://rjmseer.com/0023-4761/article/view/673560
- DOI: https://doi.org/10.31857/S0023476123010034
- EDN: https://elibrary.ru/DMXWZF
- ID: 673560
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