Diffraction-Limited Focusing of Acoustic Waves by a Mesoscopic Flat Janus Lens

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  • Authors: Minin O.V1,2, Dzhou S.3, Baranov P.F1, Minin I.V1,2,4
  • Affiliations:
    1. National Research Tomsk Polytechnic University, 634050, Tomsk, Russia
    2. Siberian State University of Geosystems and Technologies, 630010, Novosibirsk, Russia
    3. Jiangsu Key Laboratory of Advanced Manufacturing Technology, Faculty of Mechanical and Material Engineering, Huaiyin Institute of Technology, 223003, Huai’an, People’s Republic of China
    4. Design and Technology Institute of Applied Microelectronics, Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, 630090, Novosibirsk, Russia
  • Issue: Vol 117, No 9-10 (5) (2023)
  • Pages: 727-733
  • Section: Articles
  • URL: https://rjmseer.com/0370-274X/article/view/662546
  • DOI: https://doi.org/10.31857/S1234567823100038
  • EDN: https://elibrary.ru/CKONWD
  • ID: 662546

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Abstract

Anisotropic focusing by a mesoscopic (Mie size parameter of about 18) acoustic cubic lens based on V-shaped plate structures has been simulated numerically and confirmed experimentally. It has been shown for the first time that this lens with an edge dimension of about three wavelengths ensures the focusing of an acoustic wave in air into a diffraction-limited region. In the inverse geometry of the structure, the lens completely reflects the incident acoustic wave.

About the authors

O. V Minin

National Research Tomsk Polytechnic University, 634050, Tomsk, Russia; Siberian State University of Geosystems and Technologies, 630010, Novosibirsk, Russia

Email: prof.minin@gmail.com

S. Dzhou

Jiangsu Key Laboratory of Advanced Manufacturing Technology, Faculty of Mechanical and Material Engineering, Huaiyin Institute of Technology, 223003, Huai’an, People’s Republic of China

Email: prof.minin@gmail.com

P. F Baranov

National Research Tomsk Polytechnic University, 634050, Tomsk, Russia

Email: prof.minin@gmail.com

I. V Minin

National Research Tomsk Polytechnic University, 634050, Tomsk, Russia; Siberian State University of Geosystems and Technologies, 630010, Novosibirsk, Russia; Design and Technology Institute of Applied Microelectronics, Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, 630090, Novosibirsk, Russia

Author for correspondence.
Email: prof.minin@gmail.com

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