| Issue |
Section |
Title |
File |
| Vol 68, No 2 (2023) |
ДИФРАКЦИЯ И РАССЕЯНИЕ
ИОНИЗИРУЮЩИХ ИЗЛУЧЕНИЙ |
COMPARATIVE X-RAY DIFFRACTOMETRY OF THE DEFECT STRUCTURE OF ZnO EPITAXIAL FILMS DEPOSITED BY MAGNETRON SPUTTERING ON C-PLANE Al2O3 SUBSTRATES IN INHOMOGENEOUS ELECTRIC FIELD |
|
| Vol 68, No 1 (2023) |
ДИФРАКЦИЯ И РАССЕЯНИЕ
ИОНИЗИРУЮЩИХ ИЗЛУЧЕНИЙ |
A New Method for Determining the Size of a Synchrotron Radiation Beam in the Focus of a Compound Refractive Lens |
|
| Vol 68, No 1 (2023) |
ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ |
DEVELOPMENT OF X-RAY METHODS FOR STUDYING PROTEIN PLANAR SYSTEMS ON A LIQUID SURFACE USING SYNCHROTRON RADIATION |
|
| Vol 69, No 6 (2024) |
ДИФРАКЦИЯ И РАССЕЯНИЕ
ИОНИЗИРУЮЩИХ ИЗЛУЧЕНИЙ |
Experimental Study of the Method of X-ray Phase-Contrast Microscopy Using a Nanofocusing Lens at KISI-Kurchatov synchrotron source |
|
