Informaçao sobre o Autor
Волковский, Ю. А.
| Edição | Seção | Título | Arquivo |
| Volume 68, Nº 2 (2023) | ДИФРАКЦИЯ И РАССЕЯНИЕ ИОНИЗИРУЮЩИХ ИЗЛУЧЕНИЙ | COMPARATIVE X-RAY DIFFRACTOMETRY OF THE DEFECT STRUCTURE OF ZnO EPITAXIAL FILMS DEPOSITED BY MAGNETRON SPUTTERING ON C-PLANE Al2O3 SUBSTRATES IN INHOMOGENEOUS ELECTRIC FIELD | |
| Volume 68, Nº 1 (2023) | ДИФРАКЦИЯ И РАССЕЯНИЕ ИОНИЗИРУЮЩИХ ИЗЛУЧЕНИЙ | A New Method for Determining the Size of a Synchrotron Radiation Beam in the Focus of a Compound Refractive Lens | |
| Volume 68, Nº 1 (2023) | ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ | DEVELOPMENT OF X-RAY METHODS FOR STUDYING PROTEIN PLANAR SYSTEMS ON A LIQUID SURFACE USING SYNCHROTRON RADIATION | |
| Volume 69, Nº 6 (2024) | ДИФРАКЦИЯ И РАССЕЯНИЕ ИОНИЗИРУЮЩИХ ИЗЛУЧЕНИЙ | Experimental Study of the Method of X-ray Phase-Contrast Microscopy Using a Nanofocusing Lens at KISI-Kurchatov synchrotron source |